Thickness-dependent magnetic and magnetoresistance properties of permalloy prepared by field assisted tilt sputtering

Movaffaq Kateb, Snorri Ingvarsson

Rannsóknarafurð: Kafli í bók/skýrslu/ráðstefnuritiRáðstefnuframlagritrýni

3 Tilvitnanir (Scopus)

Útdráttur

This paper presents magnetic and anisotropic magnetoresistance (AMR) results of permalloy Ni80Fe20 films of different thickness (10-250 nm). The films were grown by sputter deposition at an angle, with in-situ magnetic field assisting the definition of uniaxial anisotropy. The results show that there is negligible change in anisotropy field (Hk) and resistivity with thickness down to 50 nm. However, for thinner films (<50 nm) Hk and resistivity increase rapidly with decrease in film thickness. The coercivity (Hc) of our films was found to be independent of the thickness, in all cases below 1.5 Oe. The AMR increases with the film thickness and saturates at higher thicknesses.

Upprunalegt tungumálEnska
Titill gistiútgáfuSAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings
ÚtgefandiInstitute of Electrical and Electronics Engineers Inc.
ISBN-númer (rafrænt)9781509032020
DOI
ÚtgáfustaðaÚtgefið - 6 apr. 2017
Viðburður12th IEEE Sensors Applications Symposium, SAS 2017 - Glassboro, Bandaríkin
Tímalengd: 13 mar. 201715 mar. 2017

Ritröð

NafnSAS 2017 - 2017 IEEE Sensors Applications Symposium, Proceedings

Ráðstefna

Ráðstefna12th IEEE Sensors Applications Symposium, SAS 2017
Land/YfirráðasvæðiBandaríkin
Borg/bærGlassboro
Tímabil13/03/1715/03/17

Athugasemd

Publisher Copyright:
© 2017 IEEE.

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