Some implications of msc, sdl and ttcn time extensions for computer-aided test generation

Dieter Hogrefe; Beat Koch; Helmut Neukirchen

doi:10.1007/3-540-48213-X_11

Some implications of msc, sdl and ttcn time extensions for computer-aided test generation

Dieter Hogrefe, Beat Koch, Helmut Neukirchen

Faculty of Industrial Engineering, Mechanical Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Citations (Scopus)

Abstract

The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already available or currently under study in the EC Interval project. The implications for currently available test generation tools are shown and proposals for their improvement are made. The transformation of MSC-2000 time concepts into TTCN-3 code is described in detail.

Original language	English
Title of host publication	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Editors	Rick Reed, Jeanne Reed
Publisher	Springer Verlag
Pages	168-181
Number of pages	14
ISBN (Print)	3540422811, 9783540422815
DOIs	https://doi.org/10.1007/3-540-48213-X_11
Publication status	Published - 2001
Event	10th International Specification and Description Language Forum, SDL 2001 - Copenhagen, Denmark Duration: 27 Jun 2001 → 29 Jun 2001

Publication series

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume	2078
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	10th International Specification and Description Language Forum, SDL 2001
Country/Territory	Denmark
City	Copenhagen
Period	27/06/01 → 29/06/01

Bibliographical note

Publisher Copyright:
© Springer-Verlag Berlin Heidelberg 2001.

Access to Document

10.1007/3-540-48213-X_11

Cite this

Hogrefe, D., Koch, B., & Neukirchen, H. (2001). Some implications of msc, sdl and ttcn time extensions for computer-aided test generation. In R. Reed, & J. Reed (Eds.), Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (pp. 168-181). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 2078). Springer Verlag. https://doi.org/10.1007/3-540-48213-X_11

Hogrefe, Dieter ; Koch, Beat ; Neukirchen, Helmut. / Some implications of msc, sdl and ttcn time extensions for computer-aided test generation. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). editor / Rick Reed ; Jeanne Reed. Springer Verlag, 2001. pp. 168-181 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

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Hogrefe, D, Koch, B & Neukirchen, H 2001, Some implications of msc, sdl and ttcn time extensions for computer-aided test generation. in R Reed & J Reed (eds), Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 2078, Springer Verlag, pp. 168-181, 10th International Specification and Description Language Forum, SDL 2001, Copenhagen, Denmark, 27/06/01. https://doi.org/10.1007/3-540-48213-X_11

Some implications of msc, sdl and ttcn time extensions for computer-aided test generation. / Hogrefe, Dieter; Koch, Beat; Neukirchen, Helmut.
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). ed. / Rick Reed; Jeanne Reed. Springer Verlag, 2001. p. 168-181 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 2078).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Hogrefe D, Koch B, Neukirchen H. Some implications of msc, sdl and ttcn time extensions for computer-aided test generation. In Reed R, Reed J, editors, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). Springer Verlag. 2001. p. 168-181. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). doi: 10.1007/3-540-48213-X_11

Some implications of msc, sdl and ttcn time extensions for computer-aided test generation

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