Abstract
Molecular dynamics simulations, with full Coulomb interaction, are used to model short-pulse photoemission from a finite area in a microdiode. We demonstrate three emission regimes, source-limited emission, space-charge-limited emission for short pulses, and space-charge-limited emission for the steady state. We show that beam brightness is at a maximum during the transition from the source-limited emission regime to the space-charge-limited emission regime for short pulses. From our simulations, it is apparent that the emitter spot size is an important factor when estimating the critical charge density for short-pulse electron emission and that simple capacitive models may considerably underestimate the total charge emitted.
Original language | English |
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Pages (from-to) | 2084-2091 |
Number of pages | 8 |
Journal | IEEE Transactions on Electron Devices |
Volume | 71 |
Issue number | 3 |
DOIs | |
Publication status | Published - 19 Jan 2024 |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
Other keywords
- Brightness
- photoemission
- space-charge-limited