Power regulation and electromigration in platinum microwires

Ottó Elíasson; Gabriel Vasile; Sigurður Ægir Jónsson; Guðjón I. Gudjonsson; Mustafa Arikan; Snorri Ingvarsson

doi:10.1063/1.4901937

Power regulation and electromigration in platinum microwires

Ottó Elíasson^*, Gabriel Vasile, Sigurður Ægir Jónsson, Guðjón I. Gudjonsson, Mustafa Arikan, Snorri Ingvarsson

^*Corresponding author for this work

Faculty of Physical Sciences

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We introduce a new experimental setup with a biasing circuit and computer control for electrical power regulation under reversing polarity in Pt microwires with dimensions of 1×10 μm². The circuit is computer controlled via a data acquisition board. It amplifies a control signal from the computer and drives current of alternating polarity through the sample in question. Time-to-failure investigations under DC and AC current stress are performed. We confirm that AC current stress can improve the life time of microwires at least by a factor of 10³ compared to the corresponding time-to-failure under DC current stress.

Original language	English
Article number	114709
Journal	Review of Scientific Instruments
Volume	85
Issue number	11
DOIs	https://doi.org/10.1063/1.4901937
Publication status	Published - 1 Nov 2014

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© 2014 AIP Publishing LLC.

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title = "Power regulation and electromigration in platinum microwires",

abstract = "We introduce a new experimental setup with a biasing circuit and computer control for electrical power regulation under reversing polarity in Pt microwires with dimensions of 1×10 μm2. The circuit is computer controlled via a data acquisition board. It amplifies a control signal from the computer and drives current of alternating polarity through the sample in question. Time-to-failure investigations under DC and AC current stress are performed. We confirm that AC current stress can improve the life time of microwires at least by a factor of 103 compared to the corresponding time-to-failure under DC current stress.",

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AU - Elíasson, Ottó

AU - Vasile, Gabriel

AU - Ægir Jónsson, Sigurður

AU - Gudjonsson, Guðjón I.

AU - Arikan, Mustafa

AU - Ingvarsson, Snorri

PY - 2014/11/1

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N2 - We introduce a new experimental setup with a biasing circuit and computer control for electrical power regulation under reversing polarity in Pt microwires with dimensions of 1×10 μm2. The circuit is computer controlled via a data acquisition board. It amplifies a control signal from the computer and drives current of alternating polarity through the sample in question. Time-to-failure investigations under DC and AC current stress are performed. We confirm that AC current stress can improve the life time of microwires at least by a factor of 103 compared to the corresponding time-to-failure under DC current stress.

AB - We introduce a new experimental setup with a biasing circuit and computer control for electrical power regulation under reversing polarity in Pt microwires with dimensions of 1×10 μm2. The circuit is computer controlled via a data acquisition board. It amplifies a control signal from the computer and drives current of alternating polarity through the sample in question. Time-to-failure investigations under DC and AC current stress are performed. We confirm that AC current stress can improve the life time of microwires at least by a factor of 103 compared to the corresponding time-to-failure under DC current stress.

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JF - Review of Scientific Instruments

SN - 0034-6748

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ER -

Power regulation and electromigration in platinum microwires

Abstract

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