A new metric for 3-D optical pattern recognition system

Abdul Ahad S. Awwal*, Karl S. Gudmundsson, M. Tabrez, M. Rahman, M. S. Alam, K. M. Iftekharuddin

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)

Abstract

In this paper, a novel metric is defined that will allow one to compare the performance of 3-D pattern recognition systems. Any real object is inherently, three-dimensional. Therefore, any input object for an automated target recognition system should be ideally compared to the 3-D information about the object. The proposed metric captures the essence of such comparisons.

Original languageEnglish
Pages (from-to)183-190
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4788
DOIs
Publication statusPublished - 2002
EventPhotonic Devices and Algorithms for Computing IV - Seattle, WA, United States
Duration: 8 Jul 20029 Jul 2002

Other keywords

  • Automated target recognition (ATR)
  • Complex matched filter
  • Correlation
  • Pattern recognition
  • Phase-only-filter

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