A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

M. Klosowski, J. Jakusz, W. Jendernalik, G. Blakiewicz, S. Szczepanski, S. Koziel

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	IEEE Transactions on Instrumentation and Measurement
DOIs	https://doi.org/10.1109/TIM.2018.2814118
Publication status	Published - Oct 2018

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title = "A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors",

author = "M. Klosowski and J. Jakusz and W. Jendernalik and G. Blakiewicz and S. Szczepanski and S. Koziel",

year = "2018",

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doi = "10.1109/TIM.2018.2814118",

language = "English",

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T1 - A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

AU - Klosowski, M.

AU - Jakusz, J.

AU - Jendernalik, W.

AU - Blakiewicz, G.

AU - Szczepanski, S.

AU - Koziel, S.

PY - 2018/10

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JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

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