Abstract
Relational learning in networked data has been shown to be effective in a number of studies. Relational learners, composed of relational classifiers and collective inference methods, enable the inference of nodes in a network given the existence and strength of links to other nodes. These methods have been adapted to predict customer churn in telecommunication companies showing that incorporating them may give more accurate predictions. In this research, the performance of a variety of relational learners is compared by applying them to a number of CDR datasets originating from the telecommunication industry, with the goal to rank them as a whole and investigate the effects of relational classifiers and collective inference methods separately. Our results show that collective inference methods do not improve the performance of relational classifiers and the best performing relational classifier is the network-only link-based classifier, which builds a logistic model using link-based measures for the nodes in the network.
Original language | English |
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Title of host publication | Proceedings of the 2016 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2016 |
Editors | Ravi Kumar, James Caverlee, Hanghang Tong |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1151-1158 |
Number of pages | 8 |
ISBN (Electronic) | 9781509028467 |
DOIs | |
Publication status | Published - 21 Nov 2016 |
Event | 2016 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2016 - San Francisco, United States Duration: 18 Aug 2016 → 21 Aug 2016 |
Publication series
Name | Proceedings of the 2016 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2016 |
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Conference
Conference | 2016 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining, ASONAM 2016 |
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Country/Territory | United States |
City | San Francisco |
Period | 18/08/16 → 21/08/16 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.